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Cpk Process Capability Calculator

Turn spec limits and a stable sample into Cp, Cpk and an estimated defect rate, so you can tell whether a process is capable or just lucky. Your numbers stay in your browser.

Process capability (Cpk)

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Cp (potential)
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Estimated DPMO
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Cpu (upper)
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Cpl (lower)
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How this is calculated

Capability indices compare how wide your specification window is against how much your process actually varies. A capable process fits comfortably inside its limits.

Cp = (USL − LSL) ÷ (6 × sigma)
Cpu = (USL − mean) ÷ (3 × sigma)
Cpl = (mean − LSL) ÷ (3 × sigma)
Cpk = the smaller of Cpu and Cpl

The estimated defect rate uses the standardized distance from the mean to each spec limit and the normal distribution tail beyond it. The calculator implements an accurate rational approximation of the error function to compute those tails.

z_upper = 3 × Cpu, z_lower = 3 × Cpl
DPMO ≈ 1,000,000 × ( tail(z_upper) + tail(z_lower) )
where tail(z) = 1 − Φ(z), the area beyond z under a standard normal

A rough sigma level is reported as three times Cpk, the common shorthand that links capability to a short-term sigma rating.

Sigma level ≈ 3 × Cpk

Cp versus Cpk, and what this assumes

Capability tells you whether a process can hold spec; yield tells you what actually got through. Pair this with the first pass yield and RTY calculator and price the fallout with the cost of quality calculator. For the improvement system around it, see lean manufacturing.

Make capability visible in real time

Harmony connects your machines, gauges, and quality records into one real-time operational layer, no rip-and-replace, so drift toward a spec limit shows up as it happens instead of in next month's capability study. Read the CLS case study.

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